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Detecting and Preventing Measurement Errors
October-December 1997 (vol. 14 no. 4)
pp. 78-86
ASCII Text
x 
 
Keith A. Jenkins, "Detecting and Preventing Measurement Errors," IEEE Design and Test of Computers, vol. 14, no. 4, pp. 78-86, October-December, 1997.
 
 
BibTex
x
 
@article{ 10.1109/54.632884,
author = {Keith A. Jenkins},
title = {Detecting and Preventing Measurement Errors},
journal ={IEEE Design and Test of Computers},
volume = {14},
number = {4},
issn = {0740-7475},
year = {1997},
pages = {78-86},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.632884},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Detecting and Preventing Measurement Errors
IS - 4
SN - 0740-7475
SP78
EP86
EPD - 78-86
A1 - Keith A. Jenkins,
PY - 1997
KW - electron-beam probing
KW - e-beam testing
KW - measurement errors
KW - VLSI
KW - internal signals
KW - internal waveforms
VL - 14
JA - IEEE Design and Test of Computers
ER -
 
The accuracy of electron-beam waveform measurements is discussed, and the source of several potential measurement errors is described. The importance of testing for such errors is emphasized. Examples of detectable errors in waveform amplitude, waveform noise, and time resolution, are presented and discussed. Where appropriate, methods of avoiding such errors are described.
Index Terms:
electron-beam probing, e-beam testing, measurement errors, VLSI, internal signals, internal waveforms
Citation:
Keith A. Jenkins, "Detecting and Preventing Measurement Errors," IEEE Design and Test of Computers, vol. 14, no. 4, pp. 78-86, Oct.-Dec. 1997, doi:10.1109/54.632884
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