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Automated Diagnosis in Testing and Failure Analysis
July-September 1997 (vol. 14 no. 3)
pp. 83-89
ASCII Text
x 
 
Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena, "Automated Diagnosis in Testing and Failure Analysis," IEEE Design and Test of Computers, vol. 14, no. 3, pp. 83-89, July-September, 1997.
 
 
BibTex
x
 
@article{ 10.1109/54.606003,
author = {Kenneth M. Butler and Karl Johnson and Jeff Platt and Anjali Kinra and Jayashree Saxena},
title = {Automated Diagnosis in Testing and Failure Analysis},
journal ={IEEE Design and Test of Computers},
volume = {14},
number = {3},
issn = {0740-7475},
year = {1997},
pages = {83-89},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.606003},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Automated Diagnosis in Testing and Failure Analysis
IS - 3
SN - 0740-7475
SP83
EP89
EPD - 83-89
A1 - Kenneth M. Butler,
A1 - Karl Johnson,
A1 - Jeff Platt,
A1 - Anjali Kinra,
A1 - Jayashree Saxena,
PY - 1997
VL - 14
JA - IEEE Design and Test of Computers
ER -
 
In order to meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast becoming a requirement. The use of these techniques affects many parts of the product design and manufacturing processes. This paper describes the development and deployment of an automated diagnosis methodology within Texas Instruments.
Citation:
Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena, "Automated Diagnosis in Testing and Failure Analysis," IEEE Design and Test of Computers, vol. 14, no. 3, pp. 83-89, July-Sept. 1997, doi:10.1109/54.606003
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