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Diagnosing IC Failures in a Fast Environment
July-September 1997 (vol. 14 no. 3)
pp. 70-75
ASCII Text
x 
 
Donald Staab, Eugene R. Hnatek, "Diagnosing IC Failures in a Fast Environment," IEEE Design and Test of Computers, vol. 14, no. 3, pp. 70-75, July-September, 1997.
 
 
BibTex
x
 
@article{ 10.1109/54.606000,
author = {Donald Staab and Eugene R. Hnatek},
title = {Diagnosing IC Failures in a Fast Environment},
journal ={IEEE Design and Test of Computers},
volume = {14},
number = {3},
issn = {0740-7475},
year = {1997},
pages = {70-75},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.606000},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Diagnosing IC Failures in a Fast Environment
IS - 3
SN - 0740-7475
SP70
EP75
EPD - 70-75
A1 - Donald Staab,
A1 - Eugene R. Hnatek,
PY - 1997
VL - 14
JA - IEEE Design and Test of Computers
ER -
 

Failure analysts no longer can wait till defective products come back from the field. Today, they must take a proactive role, detecting failures before they occur and helping designers eliminate their causes.

Citation:
Donald Staab, Eugene R. Hnatek, "Diagnosing IC Failures in a Fast Environment," IEEE Design and Test of Computers, vol. 14, no. 3, pp. 70-75, July-Sept. 1997, doi:10.1109/54.606000
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