Manoj Sachdev,
"Open Defects in CMOS RAM Address Decoders,"
IEEE Design and Test of Computers, vol. 14, no. 2, pp. 26-33, April-June, 1997.
BibTex
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@article{
10.1109/54.587738, author = {Manoj Sachdev}, title = {Open Defects in CMOS RAM Address Decoders}, journal ={IEEE Design and Test of Computers}, volume = {14}, number = {2}, issn = {0740-7475}, year = {1997}, pages = {26-33}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.587738}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - MGZN JO - IEEE Design and Test of Computers TI - Open Defects in CMOS RAM Address Decoders IS - 2 SN - 0740-7475 SP26 EP33 EPD - 26-33 A1 - Manoj Sachdev, PY - 1997 VL - 14 JA - IEEE Design and Test of Computers ER -
Field failures of embedded SRAMs led the author to identify open defects that escape detection by conventional march tests. Appropriate decoder-testing and DFT strategies can uncover these hard-to-detect defects.
Citation:
Manoj Sachdev, "Open Defects in CMOS RAM Address Decoders," IEEE Design and Test of Computers, vol. 14, no. 2, pp. 26-33, Apr.-June 1997, doi:10.1109/54.587738
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