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Open Defects in CMOS RAM Address Decoders
April-June 1997 (vol. 14 no. 2)
pp. 26-33
ASCII Text
x 
 
Manoj Sachdev, "Open Defects in CMOS RAM Address Decoders," IEEE Design and Test of Computers, vol. 14, no. 2, pp. 26-33, April-June, 1997.
 
 
BibTex
x
 
@article{ 10.1109/54.587738,
author = {Manoj Sachdev},
title = {Open Defects in CMOS RAM Address Decoders},
journal ={IEEE Design and Test of Computers},
volume = {14},
number = {2},
issn = {0740-7475},
year = {1997},
pages = {26-33},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.587738},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Open Defects in CMOS RAM Address Decoders
IS - 2
SN - 0740-7475
SP26
EP33
EPD - 26-33
A1 - Manoj Sachdev,
PY - 1997
VL - 14
JA - IEEE Design and Test of Computers
ER -
 

Field failures of embedded SRAMs led the author to identify open defects that escape detection by conventional march tests. Appropriate decoder-testing and DFT strategies can uncover these hard-to-detect defects.

Citation:
Manoj Sachdev, "Open Defects in CMOS RAM Address Decoders," IEEE Design and Test of Computers, vol. 14, no. 2, pp. 26-33, Apr.-June 1997, doi:10.1109/54.587738
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