loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Alpha 21164 Testability Strategy
January-March 1997 (vol. 14 no. 1)
pp. 25-33
ASCII Text
x 
 
Dilip K. Bhavsar, John H. Edmondson, "Alpha 21164 Testability Strategy," IEEE Design and Test of Computers, vol. 14, no. 1, pp. 25-33, January-March, 1997.
 
 
BibTex
x
 
@article{ 10.1109/54.573357,
author = {Dilip K. Bhavsar and John H. Edmondson},
title = {Alpha 21164 Testability Strategy},
journal ={IEEE Design and Test of Computers},
volume = {14},
number = {1},
issn = {0740-7475},
year = {1997},
pages = {25-33},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.573357},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Alpha 21164 Testability Strategy
IS - 1
SN - 0740-7475
SP25
EP33
EPD - 25-33
A1 - Dilip K. Bhavsar,
A1 - John H. Edmondson,
PY - 1997
KW - Processor design
KW - testability
KW - DFT
KW - Alpha 21164
KW - manufacture
KW - RISCs
VL - 14
JA - IEEE Design and Test of Computers
ER -
 

We describe the testability strategy and design-for-test features of the Alpha 21164 microprocessor. We discuss the specific testability and manufacturability issues of the chip and the innovative solutions employed to solve them.

The Alpha 21164 microprocessor is a superscalar implementation of Digital's 64-bit RISC architecture designed to meet the requirements of a wide variety of systems ranging from PC clients to enterprise server systems.

Index Terms:
Processor design, testability, DFT, Alpha 21164, manufacture, RISCs
Citation:
Dilip K. Bhavsar, John H. Edmondson, "Alpha 21164 Testability Strategy," IEEE Design and Test of Computers, vol. 14, no. 1, pp. 25-33, Jan.-Mar. 1997, doi:10.1109/54.573357
Usage of this product signifies your acceptance of the Terms of Use.