Intel and the Myths of Test

Design&Test
1996
Issue No. 1 - Spring
Abstract - Intel and the Myths of Test

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Spring 1996 (vol. 13 no. 1)

pp. 79-81

	ASCII Text	x
	Kenneth M. Thompson, "Intel and the Myths of Test," IEEE Design and Test of Computers, vol. 13, no. 1, pp. 79-81, Spring, 1996.

	BibTex	x
	@article{ 10.1109/54.485786, author = {Kenneth M. Thompson}, title = {Intel and the Myths of Test}, journal ={IEEE Design and Test of Computers}, volume = {13}, number = {1}, issn = {0740-7475}, year = {1996}, pages = {79-81}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.485786}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Intel and the Myths of Test IS - 1 SN - 0740-7475 SP79 EP81 EPD - 79-81 A1 - Kenneth M. Thompson, PY - 1996 VL - 13 JA - IEEE Design and Test of Computers ER -

Kenneth M. Thompson

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.485786

The author shares part of his ITC 95 keynote speech in which he described device testing at Intel, a company that tests 50 million microprocessors a year. He notes some myths that have grown up around testing and addresses the challenges facing test engineers, test system designers, and researchers.

Citation:

Kenneth M. Thompson, "Intel and the Myths of Test," IEEE Design and Test of Computers, vol. 13, no. 1, pp. 79-81, Mar. 1996, doi:10.1109/54.485786

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