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Using a Test-Specification Format in Automatic Test-Program Generation
January/February 1990 (vol. 7 no. 1)
pp. 39-45
ASCII Text
x 
 
Bas Verhelst, "Using a Test-Specification Format in Automatic Test-Program Generation," IEEE Design and Test of Computers, vol. 7, no. 1, pp. 39-45, January/February, 1990.
 
 
BibTex
x
 
@article{ 10.1109/54.46892,
author = {Bas Verhelst},
title = {Using a Test-Specification Format in Automatic Test-Program Generation},
journal ={IEEE Design and Test of Computers},
volume = {7},
number = {1},
issn = {0740-7475},
year = {1990},
pages = {39-45},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.46892},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Using a Test-Specification Format in Automatic Test-Program Generation
IS - 1
SN - 0740-7475
SP39
EP45
EPD - 39-45
A1 - Bas Verhelst,
PY - 1990
VL - 7
JA - IEEE Design and Test of Computers
ER -
 

The author suggests that if the information necessary for testing a digital IC or printed-circuit board is kept and transferred in a standardized format, testing will be much easier. He describes the concept of a test-specification format (TSF) and reports the results of experiments with two candidate TSFs. The first, Tandem, is a restricted implementation that uses ITF, aPhilips internal language, to specify tests. The practical use of a TSF was studied by evaluating NCF (neutral code format), a well-documented and stable language. Although the two languages investigated were not true TSFs, the author shows that placing a language between CAD and test systems creates a powerful environment that could greatly reduce test-preparation time and test costs.

Citation:
Bas Verhelst, "Using a Test-Specification Format in Automatic Test-Program Generation," IEEE Design and Test of Computers, vol. 7, no. 1, pp. 39-45, Jan./Feb. 1990, doi:10.1109/54.46892
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