loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Contactless High-Speed Waveform Measurements on Gallium Arsenide ICs
January/February 1990 (vol. 7 no. 1)
pp. 20-25
ASCII Text
x 
 
H.K. Seitz, A. Blacha, R. Clauberg, H. Beha, J. Feder, "Contactless High-Speed Waveform Measurements on Gallium Arsenide ICs," IEEE Design and Test of Computers, vol. 7, no. 1, pp. 20-25, January/February, 1990.
 
 
BibTex
x
 
@article{ 10.1109/54.46890,
author = {H.K. Seitz and A. Blacha and R. Clauberg and H. Beha and J. Feder},
title = {Contactless High-Speed Waveform Measurements on Gallium Arsenide ICs},
journal ={IEEE Design and Test of Computers},
volume = {7},
number = {1},
issn = {0740-7475},
year = {1990},
pages = {20-25},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.46890},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Contactless High-Speed Waveform Measurements on Gallium Arsenide ICs
IS - 1
SN - 0740-7475
SP20
EP25
EPD - 20-25
A1 - H.K. Seitz,
A1 - A. Blacha,
A1 - R. Clauberg,
A1 - H. Beha,
A1 - J. Feder,
PY - 1990
VL - 7
JA - IEEE Design and Test of Computers
ER -
 

A setup for photoemission testing, which compares favorably with results from electron-beam testing, particularly in terms of measurement time, is presented. The photoemission sampling system described has a unique detector design and a viewer for the added convenience of the equipment operator. performance results when this technique is used to measure delay and rise times on integrated gallium arsenide MESFET circuits are reported. The switching time of these circuits is around 200 ps. The system measures electrical pulses with an 8-ps rise time, so these GaAs circuits can be tested by the system. An interesting feature for special testing is the system's ability to activate devices within a chip by a pulsed visible light beam.

Citation:
H.K. Seitz, A. Blacha, R. Clauberg, H. Beha, J. Feder, "Contactless High-Speed Waveform Measurements on Gallium Arsenide ICs," IEEE Design and Test of Computers, vol. 7, no. 1, pp. 20-25, Jan./Feb. 1990, doi:10.1109/54.46890
Usage of this product signifies your acceptance of the Terms of Use.