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IEEE Std 1149.1:Where Are We? Where From Here?
Summer 1995 (vol. 12 no. 2)
pp. 53-59
ASCII Text
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Mick M.V. Tegethoff, Kenneth P. Parker, "IEEE Std 1149.1:Where Are We? Where From Here?," IEEE Design and Test of Computers, vol. 12, no. 2, pp. 53-59, Summer, 1995.
 
 
BibTex
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@article{ 10.1109/54.386006,
author = {Mick M.V. Tegethoff and Kenneth P. Parker},
title = {IEEE Std 1149.1:Where Are We? Where From Here?},
journal ={IEEE Design and Test of Computers},
volume = {12},
number = {2},
issn = {0740-7475},
year = {1995},
pages = {53-59},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.386006},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - IEEE Std 1149.1:Where Are We? Where From Here?
IS - 2
SN - 0740-7475
SP53
EP59
EPD - 53-59
A1 - Mick M.V. Tegethoff,
A1 - Kenneth P. Parker,
PY - 1995
KW - IEEE Std 1149.1
KW - Boundary-Scan
KW - Board Test
KW - BIST
KW - System Test
VL - 12
JA - IEEE Design and Test of Computers
ER -
 
This article discusses the "state of the union" of the 1149.1 standard and celebrates the success of the IEEE 1149.1 standard while motivating some discussion and future action to encourage further development of boundary scan based testing. The point of view is that of the implementer in a competitive business environment.
Index Terms:
IEEE Std 1149.1, Boundary-Scan, Board Test, BIST, System Test
Citation:
Mick M.V. Tegethoff, Kenneth P. Parker, "IEEE Std 1149.1:Where Are We? Where From Here?," IEEE Design and Test of Computers, vol. 12, no. 2, pp. 53-59, June 1995, doi:10.1109/54.386006
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