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Performing Effective Fault Isolation in Integrated Diagnostics
April/June 1993 (vol. 10 no. 2)
pp. 78-90
ASCII Text
x 
 
John W. Sheppard, William R. Simpson, "Performing Effective Fault Isolation in Integrated Diagnostics," IEEE Design and Test of Computers, vol. 10, no. 2, pp. 78-90, April/June, 1993.
 
 
BibTex
x
 
@article{ 10.1109/54.211532,
author = {John W. Sheppard and William R. Simpson},
title = {Performing Effective Fault Isolation in Integrated Diagnostics},
journal ={IEEE Design and Test of Computers},
volume = {10},
number = {2},
issn = {0740-7475},
year = {1993},
pages = {78-90},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.211532},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Performing Effective Fault Isolation in Integrated Diagnostics
IS - 2
SN - 0740-7475
SP78
EP90
EPD - 78-90
A1 - John W. Sheppard,
A1 - William R. Simpson,
PY - 1993
VL - 10
JA - IEEE Design and Test of Computers
ER -
 

Fault trees developed using an entropy-directed search process without modifications or constraints are discussed. To construct a fault tree using entropy-directed search, the computation load is reduced by determining which tests are not needed for diagnosis. The case study of an antitank missile ncher is presented in the context of a complete maintenance architecture.

Citation:
John W. Sheppard, William R. Simpson, "Performing Effective Fault Isolation in Integrated Diagnostics," IEEE Design and Test of Computers, vol. 10, no. 2, pp. 78-90, Apr. 1993, doi:10.1109/54.211532
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