loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
A Tutorial on Built-In Self-Test, Part 2: Applications
April/June 1993 (vol. 10 no. 2)
pp. 69-77
ASCII Text
x 
 
Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja, "A Tutorial on Built-In Self-Test, Part 2: Applications," IEEE Design and Test of Computers, vol. 10, no. 2, pp. 69-77, April/June, 1993.
 
 
BibTex
x
 
@article{ 10.1109/54.211530,
author = {Vishwani D. Agrawal and Charles R. Kime and Kewal K. Saluja},
title = {A Tutorial on Built-In Self-Test, Part 2: Applications},
journal ={IEEE Design and Test of Computers},
volume = {10},
number = {2},
issn = {0740-7475},
year = {1993},
pages = {69-77},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.211530},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - A Tutorial on Built-In Self-Test, Part 2: Applications
IS - 2
SN - 0740-7475
SP69
EP77
EPD - 69-77
A1 - Vishwani D. Agrawal,
A1 - Charles R. Kime,
A1 - Kewal K. Saluja,
PY - 1993
VL - 10
JA - IEEE Design and Test of Computers
ER -
 

For pt.1 see ibid., vol.10, no.1, p.73-82 (1993). The hardware structures and tools used to implement built-in self-test (BIST) pattern generation and response analysis concepts are reviewed. The authors describe testing approaches for general and structured logic, including ROMs, RAMs, and PLAs. They illustrate BIST techniques with real-world examples.

Citation:
Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja, "A Tutorial on Built-In Self-Test, Part 2: Applications," IEEE Design and Test of Computers, vol. 10, no. 2, pp. 69-77, Apr. 1993, doi:10.1109/54.211530
Usage of this product signifies your acceptance of the Terms of Use.