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Test Algorithms for Double-Buffered Random Access and Pointer-Addressed Memories
April/June 1993 (vol. 10 no. 2)
pp. 34-44
ASCII Text
x 
 
Jos van Sas, Francky Catthoor, Hugo J. De Man, "Test Algorithms for Double-Buffered Random Access and Pointer-Addressed Memories," IEEE Design and Test of Computers, vol. 10, no. 2, pp. 34-44, April/June, 1993.
 
 
BibTex
x
 
@article{ 10.1109/54.211526,
author = {Jos van Sas and Francky Catthoor and Hugo J. De Man},
title = {Test Algorithms for Double-Buffered Random Access and Pointer-Addressed Memories},
journal ={IEEE Design and Test of Computers},
volume = {10},
number = {2},
issn = {0740-7475},
year = {1993},
pages = {34-44},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.211526},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Test Algorithms for Double-Buffered Random Access and Pointer-Addressed Memories
IS - 2
SN - 0740-7475
SP34
EP44
EPD - 34-44
A1 - Jos van Sas,
A1 - Francky Catthoor,
A1 - Hugo J. De Man,
PY - 1993
VL - 10
JA - IEEE Design and Test of Computers
ER -
 

Test algorithms for static double-buffered RAMs and pointer-addressed memories (PAMs) are presented. The reasons why test algorithms for single-buffered memories are inadequate to test double-buffered memories (DBMs) are discussed. To obtain a realistic fault model, the authors perform an inductive fault analysis on the DBM cells. They also show that the address generation method imposes different requirements on the test algorithms.

Citation:
Jos van Sas, Francky Catthoor, Hugo J. De Man, "Test Algorithms for Double-Buffered Random Access and Pointer-Addressed Memories," IEEE Design and Test of Computers, vol. 10, no. 2, pp. 34-44, Apr. 1993, doi:10.1109/54.211526
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