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A Tutorial on Built-in Self-Test. I. Principles
January/March 1993 (vol. 10 no. 1)
pp. 73-82
ASCII Text
x 
 
Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja, "A Tutorial on Built-in Self-Test. I. Principles," IEEE Design and Test of Computers, vol. 10, no. 1, pp. 73-82, January/March, 1993.
 
 
BibTex
x
 
@article{ 10.1109/54.199807,
author = {Vishwani D. Agrawal and Charles R. Kime and Kewal K. Saluja},
title = {A Tutorial on Built-in Self-Test. I. Principles},
journal ={IEEE Design and Test of Computers},
volume = {10},
number = {1},
issn = {0740-7475},
year = {1993},
pages = {73-82},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.199807},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - A Tutorial on Built-in Self-Test. I. Principles
IS - 1
SN - 0740-7475
SP73
EP82
EPD - 73-82
A1 - Vishwani D. Agrawal,
A1 - Charles R. Kime,
A1 - Kewal K. Saluja,
PY - 1993
VL - 10
JA - IEEE Design and Test of Computers
ER -
 

An overview of built-in self-test (BIST) principles and practices is presented. The issues and economics underlying BIST are discussed, and the related hierarchical test structures are introduced. The fundamental BIST concepts of pattern generation and response analysis are explained. Linear feedback shift register theory is reviewed.

Citation:
Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja, "A Tutorial on Built-in Self-Test. I. Principles," IEEE Design and Test of Computers, vol. 10, no. 1, pp. 73-82, Jan. 1993, doi:10.1109/54.199807
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