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Fault Isolation in an Integrated Diagnostic Environment
January/March 1993 (vol. 10 no. 1)
pp. 52-66
ASCII Text
x 
 
William R. Simpson, John W. Sheppard, "Fault Isolation in an Integrated Diagnostic Environment," IEEE Design and Test of Computers, vol. 10, no. 1, pp. 52-66, January/March, 1993.
 
 
BibTex
x
 
@article{ 10.1109/54.199805,
author = {William R. Simpson and John W. Sheppard},
title = {Fault Isolation in an Integrated Diagnostic Environment},
journal ={IEEE Design and Test of Computers},
volume = {10},
number = {1},
issn = {0740-7475},
year = {1993},
pages = {52-66},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.199805},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Fault Isolation in an Integrated Diagnostic Environment
IS - 1
SN - 0740-7475
SP52
EP66
EPD - 52-66
A1 - William R. Simpson,
A1 - John W. Sheppard,
PY - 1993
VL - 10
JA - IEEE Design and Test of Computers
ER -
 

The use of information flow models to conduct efficient fault isolation strategies is described. Of particular concern is optimizing diagnosis to minimize some objective cost function. A technique that can include multiple cost criteria such as test time, skill level, and failure frequency, as well as information value, is discussed.

Citation:
William R. Simpson, John W. Sheppard, "Fault Isolation in an Integrated Diagnostic Environment," IEEE Design and Test of Computers, vol. 10, no. 1, pp. 52-66, Jan. 1993, doi:10.1109/54.199805
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