Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway

Design&Test
1992
Issue No. 1 - January/March
Abstract - Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway

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January/March 1992 (vol. 9 no. 1)

pp. 55-63

	ASCII Text	x
	Don L. Millard, Karl R. Umstadter, Robert C. Block, "Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway," IEEE Design and Test of Computers, vol. 9, no. 1, pp. 55-63, January/March, 1992.

	BibTex	x
	@article{ 10.1109/54.124517, author = {Don L. Millard and Karl R. Umstadter and Robert C. Block}, title = {Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway}, journal ={IEEE Design and Test of Computers}, volume = {9}, number = {1}, issn = {0740-7475}, year = {1992}, pages = {55-63}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.124517}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway IS - 1 SN - 0740-7475 SP55 EP63 EPD - 55-63 A1 - Don L. Millard, A1 - Karl R. Umstadter, A1 - Robert C. Block, PY - 1992 VL - 9 JA - IEEE Design and Test of Computers ER -

Don L. Millard

Karl R. Umstadter

Robert C. Block

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.124517

Systems using the three most popular probes applied to functional electrical testing, mechanical, electron beam, and laser, are reviewed. A system of noncontact testing that uses a laser-induced plasma 'switch' to provide the electrical pathway for AD and DC measurements on printed wiring boards is presented. With this technique, a DC resistance discrimination of less than 10 Omega and distortion-free AC measurements of a 2.5-MHz oscillator signal were achieved. These results are presented and evaluated.

Citation:

Don L. Millard, Karl R. Umstadter, Robert C. Block, "Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway," IEEE Design and Test of Computers, vol. 9, no. 1, pp. 55-63, Jan. 1992, doi:10.1109/54.124517

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