Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing

Design&Test
1992
Issue No. 1 - January/March
Abstract - Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing

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	Similar Articles Articles by Mustapha Slamani Articles by Bozena Kaminska

January/March 1992 (vol. 9 no. 1)

pp. 30-39

	ASCII Text	x
	Mustapha Slamani, Bozena Kaminska, "Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing," IEEE Design and Test of Computers, vol. 9, no. 1, pp. 30-39, January/March, 1992.

	BibTex	x
	@article{ 10.1109/54.124515, author = {Mustapha Slamani and Bozena Kaminska}, title = {Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing}, journal ={IEEE Design and Test of Computers}, volume = {9}, number = {1}, issn = {0740-7475}, year = {1992}, pages = {30-39}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.124515}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing IS - 1 SN - 0740-7475 SP30 EP39 EPD - 30-39 A1 - Mustapha Slamani, A1 - Bozena Kaminska, PY - 1992 VL - 9 JA - IEEE Design and Test of Computers ER -

Mustapha Slamani

Bozena Kaminska

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.124515

An approach based on functional testing and on sensitivity calculation of many output parameters for diagnosis of defective elements in analog circuits is presented. A sensitivity matrix that gives the relation between the deviation of output parameters and the deviation of defective components in a circuit forms the basis of the test equations. Diverse types of measurement help improve the diagnostic resolution. Experimental results are presented to clarify the algorithm and prove its efficiency in a practical case.

Citation:

Mustapha Slamani, Bozena Kaminska, "Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing," IEEE Design and Test of Computers, vol. 9, no. 1, pp. 30-39, Jan. 1992, doi:10.1109/54.124515

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