Using Inspection Data for Defect Estimation

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November/December 2000 (vol. 17 no. 6)

pp. 36-43

	ASCII Text	x
	Stefan Biffl, "Using Inspection Data for Defect Estimation," IEEE Software, vol. 17, no. 6, pp. 36-43, November/December, 2000.

	BibTex	x
	@article{ 10.1109/52.895166, author = {Stefan Biffl}, title = {Using Inspection Data for Defect Estimation}, journal ={IEEE Software}, volume = {17}, number = {6}, issn = {0740-7459}, year = {2000}, pages = {36-43}, doi = {http://doi.ieeecomputersociety.org/10.1109/52.895166}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Software TI - Using Inspection Data for Defect Estimation IS - 6 SN - 0740-7459 SP36 EP43 EPD - 36-43 A1 - Stefan Biffl, PY - 2000 VL - 17 JA - IEEE Software ER -

Stefan Biffl

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/52.895166

This article pro-poses subjective team estimation models calculated from individual estimates and investigates the accuracy of defect estimation models based on inspection data.

Citation:

Stefan Biffl, "Using Inspection Data for Defect Estimation," IEEE Software, vol. 17, no. 6, pp. 36-43, Nov./Dec. 2000, doi:10.1109/52.895166

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