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Using Inspection Data for Defect Estimation
November/December 2000 (vol. 17 no. 6)
pp. 36-43
ASCII Text
x 
 
Stefan Biffl, "Using Inspection Data for Defect Estimation," IEEE Software, vol. 17, no. 6, pp. 36-43, November/December, 2000.
 
 
BibTex
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@article{ 10.1109/52.895166,
author = {Stefan Biffl},
title = {Using Inspection Data for Defect Estimation},
journal ={IEEE Software},
volume = {17},
number = {6},
issn = {0740-7459},
year = {2000},
pages = {36-43},
doi = {http://doi.ieeecomputersociety.org/10.1109/52.895166},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Software
TI - Using Inspection Data for Defect Estimation
IS - 6
SN - 0740-7459
SP36
EP43
EPD - 36-43
A1 - Stefan Biffl,
PY - 2000
VL - 17
JA - IEEE Software
ER -
 
This article pro-poses subjective team estimation models calculated from individual estimates and investigates the accuracy of defect estimation models based on inspection data.
Citation:
Stefan Biffl, "Using Inspection Data for Defect Estimation," IEEE Software, vol. 17, no. 6, pp. 36-43, Nov./Dec. 2000, doi:10.1109/52.895166
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