Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms

Micro
1994
Issue No. 1 - February
Abstract - Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms

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February 1994 (vol. 14 no. 1)

pp. 8-11, 13-23

	ASCII Text	x
	Johan Karlsson, Peter Liden, Peter Dahlgren, Rolf Johansson, Ulf Gunneflo, "Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms," IEEE Micro, vol. 14, no. 1, pp. 8-11, 13-23, February, 1994.

	BibTex	x
	@article{ 10.1109/40.259894, author = {Johan Karlsson and Peter Liden and Peter Dahlgren and Rolf Johansson and Ulf Gunneflo}, title = {Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms}, journal ={IEEE Micro}, volume = {14}, number = {1}, issn = {0272-1732}, year = {1994}, pages = {8-11, 13-23}, doi = {http://doi.ieeecomputersociety.org/10.1109/40.259894}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Micro TI - Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms IS - 1 SN - 0272-1732 SP8 EP11, 13-23 EPD - 8-11, 13-23 A1 - Johan Karlsson, A1 - Peter Liden, A1 - Peter Dahlgren, A1 - Rolf Johansson, A1 - Ulf Gunneflo, PY - 1994 VL - 14 JA - IEEE Micro ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/40.259894

Fault injection is an effective method for studying the effects of faults in computer systems and for validating fault-handling mechanisms. The approach presented involves injecting transient faults into integrated circuits by using heavy-ion radiation from a Californium-252 source. The proliferation of safety-critical and fault-tolerant systems using VLSI technology makes such attempts to inject faults at internal locations in VLSI circuits increasingly important.

Citation:

Johan Karlsson, Peter Liden, Peter Dahlgren, Rolf Johansson, Ulf Gunneflo, "Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms," IEEE Micro, vol. 14, no. 1, pp. 8-11, 13-23, Feb. 1994, doi:10.1109/40.259894

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