Fifth International Conference on 3-D Digital Imaging and Modeling (3DIM'05) Accuracy of 3D Scanning Technologies in a Face Scanning Scenario Ottawa, Ontario, Canada June 13-June 16 ISBN: 0-7695-2327-7
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/3DIM.2005.13
In this paper, we will review several different 3D scanning devices. We will present a method for empirical accuracy analysis, and apply it to several scanners providing an overview of their technologies. The scanners include both general purpose and face specific scanning devices. We will focus on face scanning technique, although the technique should be applicable to other domains as well. The proposed method involves several different calibration faces of known shape and comparisons of their scans to investigate both absolute accuracy and repeatability.
Citation:
Chris Boehnen, Patrick Flynn, "Accuracy of 3D Scanning Technologies in a Face Scanning Scenario," 3dim, pp.310-317, Fifth International Conference on 3-D Digital Imaging and Modeling (3DIM'05), 2005 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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