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Singularities and Regularities on Line Pictures via Symmetrical Trapezoids
April 1998 (vol. 20 no. 4)
pp. 391-395
ASCII Text
x 
 
Jairo Rocha, Rafael Bernardino, "Singularities and Regularities on Line Pictures via Symmetrical Trapezoids," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 20, no. 4, pp. 391-395, April, 1998.
 
 
BibTex
x
 
@article{ 10.1109/34.677264,
author = {Jairo Rocha and Rafael Bernardino},
title = {Singularities and Regularities on Line Pictures via Symmetrical Trapezoids},
journal ={IEEE Transactions on Pattern Analysis and Machine Intelligence},
volume = {20},
number = {4},
issn = {0162-8828},
year = {1998},
pages = {391-395},
doi = {http://doi.ieeecomputersociety.org/10.1109/34.677264},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Pattern Analysis and Machine Intelligence
TI - Singularities and Regularities on Line Pictures via Symmetrical Trapezoids
IS - 4
SN - 0162-8828
SP391
EP395
EPD - 391-395
A1 - Jairo Rocha,
A1 - Rafael Bernardino,
PY - 1998
KW - Contour trapezoid
KW - maximal trapezoid set
KW - regular region
KW - singular region
KW - skeleton.
VL - 20
JA - IEEE Transactions on Pattern Analysis and Machine Intelligence
ER -
 

Abstract—An algorithm that decomposes a line image into singular and regular regions is presented. We define a contour trapezoid as the building block of regular regions, and postulate a Maximal Trapezoid Set as the core of regular regions. Then, we describe an algorithm that calculates a Maximal Trapezoid Set of a polygon and show how to use it to find a skeleton of a polygonal approximation of a contour. Experiments are explained to show the behavior of the new concept on real images as compared to previous algorithms.

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Index Terms:
Contour trapezoid, maximal trapezoid set, regular region, singular region, skeleton.
Citation:
Jairo Rocha, Rafael Bernardino, "Singularities and Regularities on Line Pictures via Symmetrical Trapezoids," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 20, no. 4, pp. 391-395, Apr. 1998, doi:10.1109/34.677264
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