Similarity and Affine Invariant Distances Between 2D Point Sets August 1995 (vol. 17 no. 8) pp. 810-814
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/34.400572
[1] K. Fukunaga, Introduction to Statistical Pattern Recognition, second edition. Academic Press, 1990.
Index Terms:
Image matching, pattern analysis, 2D affine invariance, 2D similarity invariance, image metric.
Citation:
Michael Werman, Daphna Weinshall, "Similarity and Affine Invariant Distances Between 2D Point Sets," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 17, no. 8, pp. 810-814, Aug. 1995, doi:10.1109/34.400572 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||