DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/2.920617
To reduce manufacturing costs and time to market, we must develop efficient fault detection and location methods.
Citation:
Stanislaw Deniziak, Krzysztof Sapiecha, "Developing a High-Level Fault Simulation Standard," Computer, vol. 34, no. 5, pp. 89-90, May 2001, doi:10.1109/2.920617 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||