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Computing System Failure Frequencies and Reliability Importance Measures Using OBDD
January 2004 (vol. 53 no. 1)
pp. 54-68
ASCII Text
x 
 
Yung-Ruei Chang, Suprasad V. Amari, Sy-Yen Kuo, "Computing System Failure Frequencies and Reliability Importance Measures Using OBDD," IEEE Transactions on Computers, vol. 53, no. 1, pp. 54-68, January, 2004.
 
 
BibTex
x
 
@article{ 10.1109/TC.2004.1255790,
author = {Yung-Ruei Chang and Suprasad V. Amari and Sy-Yen Kuo},
title = {Computing System Failure Frequencies and Reliability Importance Measures Using OBDD},
journal ={IEEE Transactions on Computers},
volume = {53},
number = {1},
issn = {0018-9340},
year = {2004},
pages = {54-68},
doi = {http://doi.ieeecomputersociety.org/10.1109/TC.2004.1255790},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Computers
TI - Computing System Failure Frequencies and Reliability Importance Measures Using OBDD
IS - 1
SN - 0018-9340
SP54
EP68
EPD - 54-68
A1 - Yung-Ruei Chang,
A1 - Suprasad V. Amari,
A1 - Sy-Yen Kuo,
PY - 2004
KW - Failure frequency
KW - reliability importance measure
KW - BDD
KW - imperfect coverage
KW - system availability
KW - fault tolerance.
VL - 53
JA - IEEE Transactions on Computers
ER -
 

Abstract—The recent literature showed that, in many cases, Ordered Binary Decision Diagram (OBDD)-based algorithms are more efficient in reliability evaluation compared to other methods such as the Inclusion-Exclusion (I-E) method and the sum of disjoint products (SDP) method. This paper presents algorithms based on OBDD to compute system failure frequencies and reliability importance measures. Methods are presented to calculate both steady-state and time-specific frequencies of system-failure as well as system-success. The reliability importance measures discussed in this paper include the Birnbaum importance, the Criticality importance, and other indices for the risk evaluation of a system. In addition, we propose an efficient approach based on OBDD to evaluate the reliability of a nonrepairable system and the availability of a repairable system with imperfect fault-coverage mechanisms. The powerful capability of OBDD for reliability evaluation is fully exploited in this paper. Further, we extend all of the proposed algorithms in this paper to analyze systems with imperfect fault-coverage.

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Index Terms:
Failure frequency, reliability importance measure, BDD, imperfect coverage, system availability, fault tolerance.
Citation:
Yung-Ruei Chang, Suprasad V. Amari, Sy-Yen Kuo, "Computing System Failure Frequencies and Reliability Importance Measures Using OBDD," IEEE Transactions on Computers, vol. 53, no. 1, pp. 54-68, Jan. 2004, doi:10.1109/TC.2004.1255790
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