Fault tuples have introduced a fault model independent methodology for digital circuit test analysis. However, the {0, 1, X} algebra currently used with fault tuples allows only one form of path sensitization. The sensitization options for fault tuples is enhanced based on a 5-value algebra. The 5-value algebra enables a more detailed test analysis through the selection of one of three types of sensitization. Simulation experiments performed using the ITC'99 benchmark circuits for transition and path delay faults reveal that faults can be simultaneously analyzed under different types of sensitization criteria with little increase in memory and CPU time.