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22nd IEEE VLSI Test Symposium
A Scalable On-Chip Jitter Extraction Technique
Napa Valley, California
April 25-April 29
ISBN: 0-7695-2134-7
Chee-Kian Ong, University of California, Santa Barbara
Dongwoo Hong, University of California, Santa Barbara
Kwang-Ting (Tim) Cheng, University of California, Santa Barbara
Li-C Wang, University of California, Santa Barbara
In this paper, we propose a method for extracting the spectral information of a multi-gigahertz jittery signal. This method utilizes existing on-chip single-shot period measurement techniques to sample and measure the period of multiple cycles of the multi-gigahertz periodic signal for spectral analysis. Since measurements are made on the period of multiple cycles, but not on the period of a single cycle, a lower-speed timing measurement circuitry can be used to measure a higher-speed signal. Therefore, the proposed solution is scalable for even higher-speed signals. This method does not require an external sampling clock, nor any additional measurement beyond existing techniques. Experimental results based on simulation show that this method can accurately estimate the sinusoidal and random jitters of a multi-gigahertz signal.
Citation:
Chee-Kian Ong, Dongwoo Hong, Kwang-Ting (Tim) Cheng, Li-C Wang, "A Scalable On-Chip Jitter Extraction Technique," vts, pp.267, 22nd IEEE VLSI Test Symposium, 2004
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