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22nd IEEE VLSI Test Symposium
An On-Chip Transfer Function Characterization System for Analog Built-in Testing
Napa Valley, California
April 25-April 29
ISBN: 0-7695-2134-7
ASCII Text
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Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar S?nchez-Sinencio, "An On-Chip Transfer Function Characterization System for Analog Built-in Testing," VLSI Test Symposium, IEEE, pp. 261, 22nd IEEE VLSI Test Symposium, 2004.
 
 
BibTex
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@article{ 10.1109/VTEST.2004.1299252,
author = {Alberto Valdes-Garcia and Jose Silva-Martinez and Edgar S?nchez-Sinencio},
title = {An On-Chip Transfer Function Characterization System for Analog Built-in Testing},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2004},
issn = {1093-0167},
pages = {261},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299252},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - An On-Chip Transfer Function Characterization System for Analog Built-in Testing
SN - 1093-0167
SP
EP
A1 - Alberto Valdes-Garcia,
A1 - Jose Silva-Martinez,
A1 - Edgar S?nchez-Sinencio,
PY - 2004
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Alberto Valdes-Garcia, Texas A&M University, College Station, TX
Jose Silva-Martinez, Texas A&M University, College Station, TX
Edgar S?nchez-Sinencio, Texas A&M University, College Station, TX
A compact system for the on-chip transfer function characterization of an analog circuit is presented. It consists of a phase and amplitude detector and a signal generator. A general methodology for the use of this structure in the functional verification of a circuit under test (CUT) is provided. An integrated implementation of the proposed system in CMOS 0.35 ?m technology is described along with circuit-level design considerations. Experimental results of the application of this system in the characterization of a commercial programmable gain amplifier for frequencies up to 160MHz are also presented.
Citation:
Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar S?nchez-Sinencio, "An On-Chip Transfer Function Characterization System for Analog Built-in Testing," vts, pp.261, 22nd IEEE VLSI Test Symposium, 2004
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