A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs

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	Similar Articles Articles by Mehdi B. Tahoori Articles by Edward J. McCluskey Articles by Michel Renovell Articles by Philippe Faure

22nd IEEE VLSI Test Symposium

Napa Valley, California

April 25-April 29

ISBN: 0-7695-2134-7

	ASCII Text	x
	Mehdi B. Tahoori, Edward J. McCluskey, Michel Renovell, Philippe Faure, "A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs," VLSI Test Symposium, IEEE, pp. 154, 22nd IEEE VLSI Test Symposium, 2004.

	BibTex	x
	@article{ 10.1109/VTEST.2004.1299239, author = {Mehdi B. Tahoori and Edward J. McCluskey and Michel Renovell and Philippe Faure}, title = {A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2004}, issn = {1093-0167}, pages = {154}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299239}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs SN - 1093-0167 SP EP A1 - Mehdi B. Tahoori, A1 - Edward J. McCluskey, A1 - Michel Renovell, A1 - Philippe Faure, PY - 2004 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

Mehdi B. Tahoori, Northeastern University, Boston, MA

Edward J. McCluskey, Stanford University, CA

Michel Renovell, LIRMM, France

Philippe Faure, LIRMM, France

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299239

An Application-Dependent test strategy to be used by an FPGA user is presented which requires only 3 test configurations. In this specific strategy, the interconnect is first tested by modifying the logic block configuration and preserving the interconnect configuration. Then, the used logic blocks are fully tested by modifying the interconnect configuration. Results for some benchmark applications mapped into the Xilinx FPGAs are also provided.

Citation:

Mehdi B. Tahoori, Edward J. McCluskey, Michel Renovell, Philippe Faure, "A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs," vts, pp.154, 22nd IEEE VLSI Test Symposium, 2004

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