Effects of Bit Line Coupling on the Faulty Behavior of DRAMs

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22nd IEEE VLSI Test Symposium

Napa Valley, California

April 25-April 29

ISBN: 0-7695-2134-7

	ASCII Text	x
	Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, "Effects of Bit Line Coupling on the Faulty Behavior of DRAMs," VLSI Test Symposium, IEEE, pp. 117, 22nd IEEE VLSI Test Symposium, 2004.

	BibTex	x
	@article{ 10.1109/VTEST.2004.1299234, author = {Zaid Al-Ars and Said Hamdioui and Ad J. van de Goor}, title = {Effects of Bit Line Coupling on the Faulty Behavior of DRAMs}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2004}, issn = {1093-0167}, pages = {117}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299234}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Effects of Bit Line Coupling on the Faulty Behavior of DRAMs SN - 1093-0167 SP EP A1 - Zaid Al-Ars, A1 - Said Hamdioui, A1 - Ad J. van de Goor, PY - 2004 KW - DRAMs KW - bit line coupling KW - faulty behavior KW - data backgrounds KW - Spice simulation VL - 0 JA - VLSI Test Symposium, IEEE ER -

Zaid Al-Ars, Delft University of Technology, The Netherlands

Said Hamdioui, Delft University of Technology, The Netherlands

Ad J. van de Goor, Delft University of Technology, The Netherlands

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299234

With the shrinking dimensions of manufactured structures on memory chips and the increase in memory size, bit line coupling is becoming ever more influential on the memory behavior. This paper discusses the effects of bit line coupling on the faulty behavior of DRAMs. It starts with an analytical evaluation of coupling effects, followed by a simulation-based fault analysis using a Spice simulation model. Two bit line coupling mechanisms are identified, pre-sense and post-sense coupling, and found to have a partly opposing effect on the faulty behavior. In addition, the impact of neighboring cells on these coupling mechanisms is investigated.

Index Terms:

DRAMs, bit line coupling, faulty behavior, data backgrounds, Spice simulation

Citation:

Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, "Effects of Bit Line Coupling on the Faulty Behavior of DRAMs," vts, pp.117, 22nd IEEE VLSI Test Symposium, 2004

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