Standard I{DDQ} testing is limited by the ability to distinguish a small fault current from a large background leakage current: this limitation is overcome in FPGAs by differential I{DDQ} testing. Partitioning of interconnects further increases the detectability of a fault current. Fault location can be achieved by iteratively applying partitioned differential I{DDQ} testing to eliminate fault-free nets. The location algorithm, easily automated, requires very few configurations and I{DDQ} measurements, logarithmic to the number of initially-suspected faulty nets.