loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
22nd IEEE VLSI Test Symposium
What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit?
Napa Valley, California
April 25-April 29
ISBN: 0-7695-2134-7
ASCII Text
x 
 
Manish Sharma, Janak H. Patel, "What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit?," VLSI Test Symposium, IEEE, pp. 31, 22nd IEEE VLSI Test Symposium, 2004.
 
 
BibTex
x
 
@article{ 10.1109/VTEST.2004.1299222,
author = {Manish Sharma and Janak H. Patel},
title = {What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit?},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2004},
issn = {1093-0167},
pages = {31},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299222},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit?
SN - 1093-0167
SP
EP
A1 - Manish Sharma,
A1 - Janak H. Patel,
PY - 2004
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Manish Sharma, University of Illinois at Urbana Champaign
Janak H. Patel, University of Illinois at Urbana Champaign
In this paper we analyze the coverage of distributed delay defects, on untested but functionally sensitizable paths, achieved by robustly testing a subset of paths in the circuit. This is measured by translating the information gained from robust testing into a set of linear constraints on edge delays and then using these to bound the circuit delay. Surprisingly, the results of our experiments on ISCAS benchmark circuits show that robust testing of a subset of paths in the circuit, may not cover distributed delay defects on the remaining paths very well at all.
Citation:
Manish Sharma, Janak H. Patel, "What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit?," vts, pp.31, 22nd IEEE VLSI Test Symposium, 2004
Usage of this product signifies your acceptance of the Terms of Use.