Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets

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22nd IEEE VLSI Test Symposium

Napa Valley, California

April 25-April 29

ISBN: 0-7695-2134-7

	ASCII Text	x
	Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer, "Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets," VLSI Test Symposium, IEEE, pp. 9, 22nd IEEE VLSI Test Symposium, 2004.

	BibTex	x
	@article{ 10.1109/VTEST.2004.1299219, author = {Jennifer Dworak and David Dorsey and Amy Wang and M. Ray Mercer}, title = {Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2004}, issn = {1093-0167}, pages = {9}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299219}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets SN - 1093-0167 SP EP A1 - Jennifer Dworak, A1 - David Dorsey, A1 - Amy Wang, A1 - M. Ray Mercer, PY - 2004 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

Jennifer Dworak, Texas A&M University

David Dorsey, Texas A&M University

Amy Wang, Texas A&M University

M. Ray Mercer, Texas A&M University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299219

In previous work, we have shown that optimizing the number of site observations leads to more defect detection. However, for increasingly difficult defects, optimizing patterns for balanced random excitation also enhances test effectiveness. We can also reduce the effect of undetected defects by choosing tests that minimize the likelihood of field failures.

Citation:

Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer, "Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets," vts, pp.9, 22nd IEEE VLSI Test Symposium, 2004

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