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21st IEEE VLSI Test Symposium
Analyzing Crosstalk in the Presence of Weak Bridge Defects
Napa Valley, California
April 27-May 01
ISBN: 0-7695-1924-5
Shahdad Irajpour, University of Southern California
Shahin Nazarian, University of Southern California
Lei Wang, University of Southern California
Sandeep K. Gupta, University of Southern California
Melvin A. Breuer, University of Southern California
An extensive simulation study of various combinations of resistive bridges and crosstalk has been performed and several notable properties that have significant implications for test development have been discovered. Scenarios have been identified where a combination of a bridge at one site and a crosstalk at a separate site in its transitive fanout (or vice versa) can cause slow- down/speed-up whose magnitude significantly exceeds the sum of the slow-down/speed-up caused by each effect in isolation. It has also been identified that a test vector generated for crosstalk may in fact be invalidated due to the presence of a weak bridge at the crosstalk site. The properties discovered, provide the motivation for a more analytical study that will eventually lead to the proposed framework for test development.
Citation:
Shahdad Irajpour, Shahin Nazarian, Lei Wang, Sandeep K. Gupta, Melvin A. Breuer, "Analyzing Crosstalk in the Presence of Weak Bridge Defects," vts, pp.385, 21st IEEE VLSI Test Symposium, 2003
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