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21st IEEE VLSI Test Symposium
1149.4 Based On-Line Quiescent State Monitoring Technique
Napa Valley, California
April 27-May 01
ISBN: 0-7695-1924-5
ASCII Text
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Chauchin Su, Chih-Hu Wang, Wei-Juo Wang, IS Tseng, "1149.4 Based On-Line Quiescent State Monitoring Technique," VLSI Test Symposium, IEEE, pp. 197, 21st IEEE VLSI Test Symposium, 2003.
 
 
BibTex
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@article{ 10.1109/VTEST.2003.1197651,
author = {Chauchin Su and Chih-Hu Wang and Wei-Juo Wang and IS Tseng},
title = {1149.4 Based On-Line Quiescent State Monitoring Technique},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2003},
issn = {1093-0167},
pages = {197},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197651},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - 1149.4 Based On-Line Quiescent State Monitoring Technique
SN - 1093-0167
SP
EP
A1 - Chauchin Su,
A1 - Chih-Hu Wang,
A1 - Wei-Juo Wang,
A1 - IS Tseng,
PY - 2003
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Chauchin Su, National Chiao Tung University
Chih-Hu Wang, National Central Univ.
Wei-Juo Wang, National Central Univ.
IS Tseng, Chroma ATE Inc.
On-line quiescent state monitoring is achieved by utilizing the dual comparators compatible with IEEE std. 1149.4 analog DFT. Statistical analysis is used to minimize the impacts of dynamic signal and noise carried in the signal line. The experimental results confirm the mathematical analysis and assure test methodology.
Citation:
Chauchin Su, Chih-Hu Wang, Wei-Juo Wang, IS Tseng, "1149.4 Based On-Line Quiescent State Monitoring Technique," vts, pp.197, 21st IEEE VLSI Test Symposium, 2003
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