Ultra Low Cost Analog BIST Using Spectral Analysis

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	Similar Articles Articles by Marcelo Negreiros Articles by Luigi Carro Articles by Altamiro Amadeu Susin

21st IEEE VLSI Test Symposium

Napa Valley, California

April 27-May 01

ISBN: 0-7695-1924-5

	ASCII Text	x
	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin, "Ultra Low Cost Analog BIST Using Spectral Analysis," VLSI Test Symposium, IEEE, pp. 77, 21st IEEE VLSI Test Symposium, 2003.

	BibTex	x
	@article{ 10.1109/VTEST.2003.1197636, author = {Marcelo Negreiros and Luigi Carro and Altamiro Amadeu Susin}, title = {Ultra Low Cost Analog BIST Using Spectral Analysis}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2003}, issn = {1093-0167}, pages = {77}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197636}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Ultra Low Cost Analog BIST Using Spectral Analysis SN - 1093-0167 SP EP A1 - Marcelo Negreiros, A1 - Luigi Carro, A1 - Altamiro Amadeu Susin, PY - 2003 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

Marcelo Negreiros, Universidade Federal do Rio Grande do Sul - UFRGS

Luigi Carro, Universidade Federal do Rio Grande do Sul - UFRGS

Altamiro Amadeu Susin, Universidade Federal do Rio Grande do Sul - UFRGS

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197636

In this work a low cost method to implement an analog BIST scheme for the System on Chip environment is presented. The method is based on spectral analysis and it is entirely digital. A simple and low cost 1-bit digitizer is used to capture analog information without the need for an AD converter or oversampling techniques. It also allows partitioning of the analog circuit for test thanks to the low analog area overhead of the digitizer. The mathematical framework and a test example are presented, with practica results illustrating limitations and advantages of the proposed technique.

Citation:

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin, "Ultra Low Cost Analog BIST Using Spectral Analysis," vts, pp.77, 21st IEEE VLSI Test Symposium, 2003

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