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21st IEEE VLSI Test Symposium
Effectiveness of I-V Testing in Comparison to IDDq Tests
Napa Valley, California
April 27-May 01
ISBN: 0-7695-1924-5
ASCII Text
x 
 
Thomas J Vogels, "Effectiveness of I-V Testing in Comparison to IDDq Tests," VLSI Test Symposium, IEEE, pp. 47, 21st IEEE VLSI Test Symposium, 2003.
 
 
BibTex
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@article{ 10.1109/VTEST.2003.1197632,
author = {Thomas J Vogels},
title = {Effectiveness of I-V Testing in Comparison to IDDq Tests},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2003},
issn = {1093-0167},
pages = {47},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197632},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Effectiveness of I-V Testing in Comparison to IDDq Tests
SN - 1093-0167
SP
EP
A1 - Thomas J Vogels,
PY - 2003
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Thomas J Vogels, Carnegie Mellon University
This paper will contrast the novel I-V test criteria with traditional and recent IDDq test methods. It compares their test effectiveness. We inted to show how I-V tests and IDDq tests fare in discriminating between "good" and "bad" dies and how test limits can be set empirically, especially for I-V testing. All results are based on data from an (internal) IBM experiment that was based on a large ASIC manufactured in a 0.18 ?m-Leff technology.
Citation:
Thomas J Vogels, "Effectiveness of I-V Testing in Comparison to IDDq Tests," vts, pp.47, 21st IEEE VLSI Test Symposium, 2003
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