Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs

V
VTS
2003
21st IEEE VLSI Test Symposium
Abstract - Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs

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21st IEEE VLSI Test Symposium

Napa Valley, California

April 27-May 01

ISBN: 0-7695-1924-5

	ASCII Text	x
	B. R. Benware, R. Madge, C. Lu, R. Daasch, "Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs," VLSI Test Symposium, IEEE, pp. 39, 21st IEEE VLSI Test Symposium, 2003.

	BibTex	x
	@article{ 10.1109/VTEST.2003.1197631, author = {B. R. Benware and R. Madge and C. Lu and R. Daasch}, title = {Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2003}, issn = {1093-0167}, pages = {39}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197631}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs SN - 1093-0167 SP EP A1 - B. R. Benware, A1 - R. Madge, A1 - C. Lu, A1 - R. Daasch, PY - 2003 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

B. R. Benware, LSI Logic Corporation

R. Madge, LSI Logic Corporation

C. Lu, LSI Logic Corporation

R. Daasch, Portland State University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197631

In sub-micron processes, resistive path defects are increasingly contributing to the yield loss and the customer fail pareto. Data has been collected on a series of ASIC products and compares the effectiveness of full vector set transition delay fault tests with reduced vector sets, minVDD, customer functional tests and customers system fails. Results show that fault models do not predict the defect coverage well and cost effective screening of frequency outliers and minVDD outliers is possible and is critical in improving customer quality.

Citation:

B. R. Benware, R. Madge, C. Lu, R. Daasch, "Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs," vts, pp.39, 21st IEEE VLSI Test Symposium, 2003

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