loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
20th IEEE VLSI Test Symposium
Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation
Monterey, California
April 28-May 02
ISBN: 0-7695-1570-3
ASCII Text
x 
 
Diego Vázquez, Gloria Huertas, Gildas Leger, Adoración Rueda, José L. Huertas, "Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation," VLSI Test Symposium, IEEE, pp. 0433, 20th IEEE VLSI Test Symposium, 2002.
 
 
BibTex
x
 
@article{ 10.1109/VTS.2002.1011176,
author = {Diego Vázquez and Gloria Huertas and Gildas Leger and Adoración Rueda and José L. Huertas},
title = {Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2002},
isbn = {0-7695-1570-3},
pages = {0433},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011176},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation
SN - 0-7695-1570-3
SP
EP
A1 - Diego Vázquez,
A1 - Gloria Huertas,
A1 - Gildas Leger,
A1 - Adoración Rueda,
A1 - José L. Huertas,
PY - 2002
KW - On-chip Evaluation
KW - BIST
KW - Oscillation-Based-Test
KW - Analog Testing
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Diego Vázquez, Universidad de Sevilla
Gloria Huertas, Universidad de Sevilla
Gildas Leger, Universidad de Sevilla
Adoración Rueda, Universidad de Sevilla
José L. Huertas, Universidad de Sevilla
This paper presents practical solutions for two of the main topics arising when applying Oscillation-Based-Test: the start-up of the configured oscillator and the on-chip evaluation of the generated test signals. The required circuitry is very simple and robust. Moreover, preliminary results obtained from an integrated prototype are also included.
Index Terms:
On-chip Evaluation, BIST, Oscillation-Based-Test, Analog Testing
Citation:
Diego Vázquez, Gloria Huertas, Gildas Leger, Adoración Rueda, José L. Huertas, "Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation," vts, pp.0433, 20th IEEE VLSI Test Symposium, 2002
Usage of this product signifies your acceptance of the Terms of Use.