Test Economics for Multi-site Test with Modern Cost Reduction Techniques

V
VTS
2002
20th IEEE VLSI Test Symposium
Abstract - Test Economics for Multi-site Test with Modern Cost Reduction Techniques

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	Similar Articles Articles by Erik H. Volkerink Articles by Ajay Khoche Articles by Jochen Rivoir Articles by Klaus D. Hilliges

20th IEEE VLSI Test Symposium

Monterey, California

April 28-May 02

ISBN: 0-7695-1570-3

	ASCII Text	x
	Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus D. Hilliges, "Test Economics for Multi-site Test with Modern Cost Reduction Techniques," VLSI Test Symposium, IEEE, pp. 0411, 20th IEEE VLSI Test Symposium, 2002.

	BibTex	x
	@article{ 10.1109/VTS.2002.1011173, author = {Erik H. Volkerink and Ajay Khoche and Jochen Rivoir and Klaus D. Hilliges}, title = {Test Economics for Multi-site Test with Modern Cost Reduction Techniques}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2002}, isbn = {0-7695-1570-3}, pages = {0411}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011173}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Test Economics for Multi-site Test with Modern Cost Reduction Techniques SN - 0-7695-1570-3 SP EP A1 - Erik H. Volkerink, A1 - Ajay Khoche, A1 - Jochen Rivoir, A1 - Klaus D. Hilliges, PY - 2002 VL - 0 JA - VLSI Test Symposium, IEEE ER -

Erik H. Volkerink, Agilent Laboratories

Ajay Khoche, Agilent Laboratories

Jochen Rivoir, Agilent Laboratories

Klaus D. Hilliges, Agilent Laboratories

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011173

Test approaches that can be combined with multi-site, like reduced pin-count test, low channel cost ATE, and bandwidth matching, are becoming pervasive. Yet their economic benefits, the tradeoffs, and the long-term scalability of their benefits during technology progress, are not well understood. In this paper the benefits and tradeoffs will be analyzed using technical cost modeling. The dependency of the benefits on the application will be analyzed by modeling the test cost for 4 different applications. It will be shown that the mentioned test approaches can result in a significant and scalable reduction of the Cost of Test.

Citation:

Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus D. Hilliges, "Test Economics for Multi-site Test with Modern Cost Reduction Techniques," vts, pp.0411, 20th IEEE VLSI Test Symposium, 2002

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