Approximating Infinite Dynamic Behavior for DRAM Cell Defects

V
VTS
2002
20th IEEE VLSI Test Symposium
Abstract - Approximating Infinite Dynamic Behavior for DRAM Cell Defects

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	Similar Articles Articles by Zaid Al-Ars Articles by Ad J. van de Goor

20th IEEE VLSI Test Symposium

Monterey, California

April 28-May 02

ISBN: 0-7695-1570-3

	ASCII Text	x
	Zaid Al-Ars, Ad J. van de Goor, "Approximating Infinite Dynamic Behavior for DRAM Cell Defects," VLSI Test Symposium, IEEE, pp. 0401, 20th IEEE VLSI Test Symposium, 2002.

	BibTex	x
	@article{ 10.1109/VTS.2002.1011171, author = {Zaid Al-Ars and Ad J. van de Goor}, title = {Approximating Infinite Dynamic Behavior for DRAM Cell Defects}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2002}, isbn = {0-7695-1570-3}, pages = {0401}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011171}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Approximating Infinite Dynamic Behavior for DRAM Cell Defects SN - 0-7695-1570-3 SP EP A1 - Zaid Al-Ars, A1 - Ad J. van de Goor, PY - 2002 KW - infinite dynamic faults KW - DRAMs KW - functional fault models KW - defect simulation KW - memory testing VL - 0 JA - VLSI Test Symposium, IEEE ER -

Zaid Al-Ars, Delft University of Technology

Ad J. van de Goor, Delft University of Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011171

Analyzing the dynamic faulty behavior in DRAMs is a severely time consuming task, because of the exponential growth of the analysis time needed with each memory operation added to the sensitizing operation sequence of the fault. In this paper, a new fault analysis approach for DRAM cell defects is presented where the total infinite space of dynamic faulty behavior can be approxiated within a limited amount of analysis time. The paper also presents the analysis results for some cell defects using the new approach, in combination with detection conditions that guarantee the detection of any detectable dynamic faults in the defective cell.

Index Terms:

infinite dynamic faults, DRAMs, functional fault models, defect simulation, memory testing

Citation:

Zaid Al-Ars, Ad J. van de Goor, "Approximating Infinite Dynamic Behavior for DRAM Cell Defects," vts, pp.0401, 20th IEEE VLSI Test Symposium, 2002

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