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20th IEEE VLSI Test Symposium
Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus
Monterey, California
April 28-May 02
ISBN: 0-7695-1570-3
ASCII Text
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Jose Vicente Calvano, Vladimir Castro Alves, Antonio C. Mesquita, Marcelo Lubaszewski, "Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus," VLSI Test Symposium, IEEE, pp. 0201, 20th IEEE VLSI Test Symposium, 2002.
 
 
BibTex
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@article{ 10.1109/VTS.2002.1011139,
author = {Jose Vicente Calvano and Vladimir Castro Alves and Antonio C. Mesquita and Marcelo Lubaszewski},
title = {Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2002},
isbn = {0-7695-1570-3},
pages = {0201},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011139},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus
SN - 0-7695-1570-3
SP
EP
A1 - Jose Vicente Calvano,
A1 - Vladimir Castro Alves,
A1 - Antonio C. Mesquita,
A1 - Marcelo Lubaszewski,
PY - 2002
KW - analog test
KW - mixed-signal test
KW - design for test
KW - BIST
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Jose Vicente Calvano, Brazilian Navy Research Institute
Vladimir Castro Alves, Federal University of Rio de Janeiro
Antonio C. Mesquita, Federal University of Rio de Janeiro
Marcelo Lubaszewski, Federal University of Rio Grande do Su
This work presents a design for test method for continuous time active filters of any order, using the IEEE 1149.4 as its backbone structure. The method relies on the synthesis of filter transfer functions using partial fraction extraction. Transfer functions are built from 1st order blocks connected via the available standard infrastructure. Under this approach, structural test can be carried out using simple test vectors, which are disclosed according to a fault simulation process.
Index Terms:
analog test, mixed-signal test, design for test, BIST
Citation:
Jose Vicente Calvano, Vladimir Castro Alves, Antonio C. Mesquita, Marcelo Lubaszewski, "Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus," vts, pp.0201, 20th IEEE VLSI Test Symposium, 2002
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