Diagnosis of Sequence-Dependent Chips

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	Similar Articles Articles by James C.-M. Li Articles by E. J. McCluskey

20th IEEE VLSI Test Symposium

Monterey, California

April 28-May 02

ISBN: 0-7695-1570-3

	ASCII Text	x
	James C.-M. Li, E. J. McCluskey, "Diagnosis of Sequence-Dependent Chips," VLSI Test Symposium, IEEE, pp. 0187, 20th IEEE VLSI Test Symposium, 2002.

	BibTex	x
	@article{ 10.1109/VTS.2002.1011137, author = {James C.-M. Li and E. J. McCluskey}, title = {Diagnosis of Sequence-Dependent Chips}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2002}, isbn = {0-7695-1570-3}, pages = {0187}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011137}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Diagnosis of Sequence-Dependent Chips SN - 0-7695-1570-3 SP EP A1 - James C.-M. Li, A1 - E. J. McCluskey, PY - 2002 VL - 0 JA - VLSI Test Symposium, IEEE ER -

James C.-M. Li, Stanford University

E. J. McCluskey, Stanford University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011137

A technique capable of diagnosing single and multiple stuck-open and stuck-at faults is presented. Eleven sequence-dependent chips (test results depend on the order of test patterns) are diagnosed. Seven of them are diagnosed as having single stuck-open faults. Two of them are diagnosed as having multiple stuck-at and stuck-open faults.

Citation:

James C.-M. Li, E. J. McCluskey, "Diagnosis of Sequence-Dependent Chips," vts, pp.0187, 20th IEEE VLSI Test Symposium, 2002

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