Very-Low-Voltage Ultra-Low-Voltage (a modified version of Minimum-Voltage), and Energy Consumption Ratio (a recently developed test metric) tests are applied as supplemental tests along with existing traditional tests to a biomedical IC product. The effectiveness and efficiency of these supplemental tests are evaluated and compared with some major traditional tests. The effectiveness analysis indicates that Ultra-Low-Voltage and Energy Consumption Ratio tests identified potentially defective devices from the good devices. The efficiency analysis shows that Energy Consumption Ratio test is much more efficient than Very-Low-Voltage Ultra-Low-Voltage and major traditional tests.