MINVDD Testing for Weak CMOS ICs

V
VTS
2001
19th IEEE VLSI Test Symposium
Abstract - MINVDD Testing for Weak CMOS ICs

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19th IEEE VLSI Test Symposium

Marina Del Rey, CA

March 29-April 03

ISBN: 0-7695-1122-8

	ASCII Text	x
	Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh, "MINVDD Testing for Weak CMOS ICs," VLSI Test Symposium, IEEE, pp. 0339, 19th IEEE VLSI Test Symposium, 2001.

	BibTex	x
	@article{ 10.1109/VTS.2001.923459, author = {Chao-Wen Tseng and Ray Chen and Edward J. McCluskey and Phil Nigh}, title = {MINVDD Testing for Weak CMOS ICs}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2001}, isbn = {0-7695-1122-8}, pages = {0339}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.923459}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - MINVDD Testing for Weak CMOS ICs SN - 0-7695-1122-8 SP EP A1 - Chao-Wen Tseng, A1 - Ray Chen, A1 - Edward J. McCluskey, A1 - Phil Nigh, PY - 2001 VL - 0 JA - VLSI Test Symposium, IEEE ER -

Chao-Wen Tseng, Stanford University

Ray Chen, Stanford University

Edward J. McCluskey, Stanford University

Phil Nigh, IBM MicroElectronics

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2001.923459

A weak chip is one that contains flaws - defects that do not interfere with correct circuit operation at normal conditions but may cause intermittent or early-life failures. MINVDD testing can detect weak CMOS chips. The minvdd of a chip is the minimum supply voltage value at which a chip can function correctly. It can be used to differentiate between good chips and weak chips. In the first part of this paper, we will study several types of flaws to demonstrate the effectiveness of MINVDD testing. Experimental results show that MINVDD testing is as effective as VLV testing for screening out burn-in rejects. In the second part of this paper, we propose test conditions for low voltage testing, including test voltage, test timing and test sets. Experimental results are presented to validate our proposal.

Citation:

Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh, "MINVDD Testing for Weak CMOS ICs," vts, pp.0339, 19th IEEE VLSI Test Symposium, 2001

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