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19th IEEE VLSI Test Symposium
Test Waveform Shaping in Mixed Signal Test Bus by Pre-Equalization
Marina Del Rey, CA
March 29-April 03
ISBN: 0-7695-1122-8
ASCII Text
x 
 
Yue-Tsang Chen, Chauchin Su, "Test Waveform Shaping in Mixed Signal Test Bus by Pre-Equalization," VLSI Test Symposium, IEEE, pp. 0260, 19th IEEE VLSI Test Symposium, 2001.
 
 
BibTex
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@article{ 10.1109/VTS.2001.923448,
author = {Yue-Tsang Chen and Chauchin Su},
title = {Test Waveform Shaping in Mixed Signal Test Bus by Pre-Equalization},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2001},
isbn = {0-7695-1122-8},
pages = {0260},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.923448},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Test Waveform Shaping in Mixed Signal Test Bus by Pre-Equalization
SN - 0-7695-1122-8
SP
EP
A1 - Yue-Tsang Chen,
A1 - Chauchin Su,
PY - 2001
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Yue-Tsang Chen, Chung Shan Institute of Science and Technology
Chauchin Su, National Central University
A DSP based methodology to generate compensative stimuli is proposed to remove the parasitic effects in analog test buses. Experiments, using HSPICE simulation, show that the differences between stimuli and ideal signal are less then 1% with only 64 sample points.
Citation:
Yue-Tsang Chen, Chauchin Su, "Test Waveform Shaping in Mixed Signal Test Bus by Pre-Equalization," vts, pp.0260, 19th IEEE VLSI Test Symposium, 2001
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