Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging

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	Similar Articles Articles by E.S. Sogomonyan Articles by A. Morosov Articles by J. Rzeha Articles by M. Gossel Articles by A. Singh

19th IEEE VLSI Test Symposium

Marina Del Rey, CA

March 29-April 03

ISBN: 0-7695-1122-8

	ASCII Text	x
	E.S. Sogomonyan, A. Morosov, J. Rzeha, M. Gossel, A. Singh, "Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging," VLSI Test Symposium, IEEE, pp. 0184, 19th IEEE VLSI Test Symposium, 2001.

	BibTex	x
	@article{ 10.1109/VTS.2001.923437, author = {E.S. Sogomonyan and A. Morosov and J. Rzeha and M. Gossel and A. Singh}, title = {Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2001}, isbn = {0-7695-1122-8}, pages = {0184}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.923437}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging SN - 0-7695-1122-8 SP EP A1 - E.S. Sogomonyan, A1 - A. Morosov, A1 - J. Rzeha, A1 - M. Gossel, A1 - A. Singh, PY - 2001 VL - 0 JA - VLSI Test Symposium, IEEE ER -

E.S. Sogomonyan, Russian Academy of Science

A. Morosov, Potsdam University

J. Rzeha, Potsdam University

M. Gossel, Potsdam University

A. Singh, Auburn University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2001.923437

In this paper we propose1 a new method for the design of duplex fault-tolerant systems with early error detection and high availability. All the scannable memory elements (Flip-Flops) of the duplicated system are implemented as multi-mode memory elements according to [9] allowing during normal operation to accumulate a signature of its states in its scan-paths. By continously comparing a 1-bit sequence of the compacted scan-out outputs of the accumulated signatures of the duplicated systems an error can be already detected and a recovery procedure started before an erroneous result appears at the system outputs when a computations is completed. The accumulation of a signature during normal operation can also be used for debugging at-speed. For this application the system need not be duplicated.

Citation:

E.S. Sogomonyan, A. Morosov, J. Rzeha, M. Gossel, A. Singh, "Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging," vts, pp.0184, 19th IEEE VLSI Test Symposium, 2001

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