"Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue," VLSI Test Symposium, IEEE, pp. 0153, 19th IEEE VLSI Test Symposium, 2001.

@article{ 10.1109/VTS.2001.10020,
author = {},
title = {Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2001},
isbn = {0-7695-1122-8},
pages = {0153},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.10020},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue
SN - 0-7695-1122-8
SP
EP
PY - 2001
VL - 0
JA - VLSI Test Symposium, IEEE
ER -