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19th IEEE VLSI Test Symposium
Diagnosis of Tunneling Opens
Marina Del Rey, CA
March 29-April 03
ISBN: 0-7695-1122-8
ASCII Text
x 
 
James C.-M. Li, E.J. McCluskey, "Diagnosis of Tunneling Opens," VLSI Test Symposium, IEEE, pp. 0022, 19th IEEE VLSI Test Symposium, 2001.
 
 
BibTex
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@article{ 10.1109/VTS.2001.923413,
author = {James C.-M. Li and E.J. McCluskey},
title = {Diagnosis of Tunneling Opens},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2001},
isbn = {0-7695-1122-8},
pages = {0022},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.923413},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Diagnosis of Tunneling Opens
SN - 0-7695-1122-8
SP
EP
A1 - James C.-M. Li,
A1 - E.J. McCluskey,
PY - 2001
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
James C.-M. Li, Stanford University
E.J. McCluskey, Stanford University
This paper resolves two issues regarding diagnosis of tunneling opens: efficient screening and accurate localization. In the first part, a test pattern selection and sorting algorithm is presented. It is shown that the presented algorithm savesIDDQ (t) test time without impacting on its effectiveness. The second part of this paper presents a locating algorithm which combines both VLV and IDDQ (t) test results. This technique is shown to be able to accurately locate the tunneling opens with higher resolution than a commercial single stuck-at fault diagnosis tool.
Citation:
James C.-M. Li, E.J. McCluskey, "Diagnosis of Tunneling Opens," vts, pp.0022, 19th IEEE VLSI Test Symposium, 2001
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