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18th IEEE VLSI Test Symposium (VTS'00)
Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs
Montreal, Canada
April 30-May 04
ISBN: 0-7695-0613-5
ASCII Text
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Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana, "Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs," VLSI Test Symposium, IEEE, pp. 444, 18th IEEE VLSI Test Symposium (VTS'00), 2000.
 
 
BibTex
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@article{ 10.1109/VTEST.2000.843877,
author = {Sri Jandhyala and Hari Balachandran and Manidip Sengupta and Anura P. Jayasumana},
title = {Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2000},
issn = {1093-0167},
pages = {444},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843877},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs
SN - 1093-0167
SP
EP
A1 - Sri Jandhyala,
A1 - Hari Balachandran,
A1 - Manidip Sengupta,
A1 - Anura P. Jayasumana,
PY - 2000
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Sri Jandhyala, Texas Instruments Inc.
Hari Balachandran, Texas Instruments Inc.
Manidip Sengupta, Texas Instruments Inc.
Anura P. Jayasumana, Colorado State University
Effectiveness of the clustering based approach in detecting devices with abnormal IDDQ values is evaluated using data from the SEMATECH test methods experiment. The results from clustering are compared to the results obtained on actual silicon during the SEMATECH study. The differences between the results obtained in each case are analyzed. The clustering approach is also compared to two common IDDQ test techniques, the single-threshold approach and the delta-IDDQ approach, and the results are presented.
Citation:
Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana, "Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs," vts, pp.444, 18th IEEE VLSI Test Symposium (VTS'00), 2000
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