18th IEEE VLSI Test Symposium (VTS'00)
The Left Edge Algorithm and the Tree Growing Technique in Block-Test Scheduling under Power Constraints
Montreal, Canada
April 30-May 04
ISBN: 0-7695-0613-5
The left-edge algorithm is adapted in this paper to deal with the problem of unequal-length block-test scheduling under power dissipation constraints. An extended tree growing technique is used in combination with the left-edge algorithm in order to improve the test concurrency under power dissipation limits. Test scheduling example is discussed highlighting further research directions towards an efficient system-level test-scheduling algorithm.
Citation:
Valentin Muresan, Xiaojun Wang, Valentina Muresan, Mircea Vladutiu, "The Left Edge Algorithm and the Tree Growing Technique in Block-Test Scheduling under Power Constraints," vts, pp.417, 18th IEEE VLSI Test Symposium (VTS'00), 2000