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18th IEEE VLSI Test Symposium (VTS'00)
Crosstalk Effect Removal for Analog Measurement in Analog Test Bus
Montreal, Canada
April 30-May 04
ISBN: 0-7695-0613-5
ASCII Text
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Chauchin Su, Yue-Tsang Chen, "Crosstalk Effect Removal for Analog Measurement in Analog Test Bus," VLSI Test Symposium, IEEE, pp. 403, 18th IEEE VLSI Test Symposium (VTS'00), 2000.
 
 
BibTex
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@article{ 10.1109/VTEST.2000.843871,
author = {Chauchin Su and Yue-Tsang Chen},
title = {Crosstalk Effect Removal for Analog Measurement in Analog Test Bus},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2000},
issn = {1093-0167},
pages = {403},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843871},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Crosstalk Effect Removal for Analog Measurement in Analog Test Bus
SN - 1093-0167
SP
EP
A1 - Chauchin Su,
A1 - Yue-Tsang Chen,
PY - 2000
KW - Analog Test
KW - Mixed Signal Test
KW - Analog Test Bus
KW - Design for Testability
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Chauchin Su, National Central University
Yue-Tsang Chen, National Central University
A DSP based test methodology is proposed to remove the parasitic and crosstalk effects, the two major drawbacks when using the analog buses. Experiments, using SPICE simulation and real measurement data show a significant improvement over the direct measurement.
Index Terms:
Analog Test, Mixed Signal Test, Analog Test Bus, Design for Testability
Citation:
Chauchin Su, Yue-Tsang Chen, "Crosstalk Effect Removal for Analog Measurement in Analog Test Bus," vts, pp.403, 18th IEEE VLSI Test Symposium (VTS'00), 2000
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